Digital LBB gaging probe system acquires precision data on machined parts

Digital LBB gaging probe system acquires precision data on machined parts

New Products |
Measurement Specialties is offering a high-precision digital gaging probe system that accurately measures manufactured parts during production for automated inspection screening and SPC (statistical process control) data collection.
By eeNews Europe


The new Digital LBB (linear ball bearing) system can accommodate up to 31 daisy-chained probes via an external power source.

The plug-and-play system is easily set up and implemented to ensure quality production in a variety of manufacturing environments. These include inspection of optics (mirrors, lenses), medical glass and cans as well as measuring wobble and run-out of rotating parts (rotors, axels), free-form dimensions (windshields, crankshafts, body panels) and diameter and run-out of machined parts (engine pistons, bearings).  Materials testing and meteorology applications also benefit from the high precision measurements provided by this system.

Networked via T-Connectors, the digital gaging probes are available in either spring or air actuated versions with stroke ranges of 1, 2, 5 and 10 mm available.  In addition to incorporating a precision linear ball bearing, each robust LVDT probe is mated to an in-line 14-bit, digital I/O signal conditioning module that performs calibration and linearity correction functions in the circuitry and firmware. This allows an extreme accuracy of either 0.1% of the reading or 1 µm, whichever is greater.

Repeatability is the greater of either 0.0065% of the range or 0.15 µm.  The new system operates from 0ºC to +60ºC with a maximum current of 60 mA and can buffer up to 240 samples per second.

The new system offers a variety of connectors and tips for its gaging probes.  It can be used as a drop-in replacement for or, using a Measurement Specialties T-Connector, as a fully-compatible version to similar industry systems.

More information about the digital gaging probe system at


Linked Articles
eeNews Analog