Rad-hard voltage references for aerospace
Specifically designed to sustain the radiation levels found in space and pin-compatible with similar industry-standard devices, these voltage references are QML-V qualified by the American Space Agency (DLA) and included in the European Preferred Parts List (EPPL) of preferred and suitable components to be used by European manufacturers of spacecraft hardware and associated equipment.
Both devices are fabricated in ST’s high-reliability 250-nm BiCMOS technology that has been proven through long-term production of high-volume consumer applications and a wide variety of ICs for demanding aerospace, automotive, and medical applications, including other radiation-hardened products such as ADCs.
The electrical performance of these devices includes a temperature coefficient of 5 ppm (typical), an accuracy of ±0.15% achieved through laser trimming, excellent part-to-part temperature-profile matching, and a wide cathode current range from 40 µA to 12 mA, allowing flexibility while keeping accuracy and stability.
The electrical performance is combined with best-in-class radiation resistance, both in Total Ionisation Dose (TID) and to Single Event Effect (SEE). The devices are ELDRS (Enhanced Low Dose Rate Sensitivity)-free up to 300 krad (their key parameters remain constant whatever the dose rate, up to a very high level), are fully immune to Single-Event Latch-up (SEL free up to 120 MeV.cm²/mg @ 125°C), and have a low probability of Single-Event Transient (SET Cross section < 3.10-4), such effects always being of very short duration and low amplitude. A detailed SET test report is available upon request.
Designed, qualified, and manufactured in Europe, the devices are supported by intensive characterisation data, a full set of macromodels (Pspice, Eldo, ADS) and demo boards.