Scanning atoms with the tip of a needle

By Spectrum Instrumentation GmbH
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Spectrum discusses the use of semiconductor manufacturing techniques to reduce the size and cost of the atomic force microscope. The paper argues the development of SOI MEMS with integrated in-plane electrostatic actuators and electrothermal sensors can go some way to expanding the use of the AFM beyond current applicaitons. The company has provided a multichannel high sample rate digitizer for use with AFM research.       Read More



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