Single-axis MEMS accelerometers for aerospace, automotive, robotic testing

August 23, 2020 //By Peter Clarke
Single-axis MEMS accelerometers for aerospace, automotive, robotic testing
The Model 2276 Series of MEMS accelerometers, from Silicon Designs Inc. (Kirkland, Washington), is for zero-to-medium frequency aerospace and automotive testing, industrial vibration monitoring and robotics instrumentation applications.

Available in eight standard ranges from ±2 g to ±400 g, the single-axis Model 2276 Series combines an integrated low-noise, nitrogen-damped, calibrated MEMS capacitive accelerometer chip together with high-drive, low-impedance buffering.

Sense elements are contained within an epoxy-sealed, rugged anodized aluminum housing. This design allows the Series to reliably withstand shock inputs of up to 5000 g, as well as standard operating temperature ranges from –55°C to +125°C. The accelerometers further offer superior bias performance, including a temperature shift coefficient of -100 to +100 PPM of span/°C, and a scale factor temperature shift coefficient of -150 to +50 PPM/°C.  Model 2276 Series accelerometers respond to both DC and AC acceleration, with choice of either two analog ±4 V (differential); or 0.5 to 4.5 V (single-ended) outputs, both of which vary with acceleration. At zero acceleration, output differential voltage is nominally 0 VDC (DC response). Onboard voltage regulation also minimizes supply voltage variation effects.

The Model 2276 Series is suitable for vibration and acceleration measurements within industrial and commercial environments, particularly in applications where an accelerometer's low mass (9 g) and small size (0.94" by 0.63" by 0.425") can help to minimize mass loading effects on the test article. Typical applications include aircraft flight and flutter testing, automotive RLDA, industrial vibration monitoring and analysis, robotics, biomechanics, industrial machinery and equipment control, modal and structural analysis, crash event detection, and general in-laboratory testing.

Related links and articles:

www.silicondesigns.com

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